Description

Band gap Eg =2.3026*103*2*kB*slope eV, (Take Boltzman constant kB=8.617*10-5 eVK-1). Method : (1) The setting of 4-point probes on the semiconductor chip is a delicate process.

The most common technique used for measuring sheet resistance is the four-probe method. This technique involves using four equally-spaced, co-linear probes (known as a four-point probe) to make electrical contact with the material. Most four-point probes available commercially use sharp needles as probes.

A four point probe is typically used to measure the sheet resistance of a thin layer or substrate in units of ohms per square by forcing current through two outer probes and reading the voltage across the two inner probes.